JPH0267281U - - Google Patents

Info

Publication number
JPH0267281U
JPH0267281U JP14540388U JP14540388U JPH0267281U JP H0267281 U JPH0267281 U JP H0267281U JP 14540388 U JP14540388 U JP 14540388U JP 14540388 U JP14540388 U JP 14540388U JP H0267281 U JPH0267281 U JP H0267281U
Authority
JP
Japan
Prior art keywords
probe
jig
test
board
relay pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14540388U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14540388U priority Critical patent/JPH0267281U/ja
Publication of JPH0267281U publication Critical patent/JPH0267281U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP14540388U 1988-11-09 1988-11-09 Pending JPH0267281U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14540388U JPH0267281U (en]) 1988-11-09 1988-11-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14540388U JPH0267281U (en]) 1988-11-09 1988-11-09

Publications (1)

Publication Number Publication Date
JPH0267281U true JPH0267281U (en]) 1990-05-22

Family

ID=31413961

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14540388U Pending JPH0267281U (en]) 1988-11-09 1988-11-09

Country Status (1)

Country Link
JP (1) JPH0267281U (en])

Similar Documents

Publication Publication Date Title
JPS63304180A (ja) 印刷回路板テスト装置
JPH11242064A (ja) 実装基板検査装置
JPH0267281U (en])
JP2585597B2 (ja) 回路基板検査装置
JPS6058831B2 (ja) 電子部品の特性検査治具
CN222599820U (zh) 一种探针模组性能检测治具
JP3224519B2 (ja) ウェーハ測定治具、テストヘッド装置およびウェーハ測定装置
JPS63185572U (en])
JPS60183879U (ja) 半導体試験装置の接触子
JPH0430550Y2 (en])
JPH10300822A (ja) Icテスタのプローブコンタクトピンのストローク測定法
JPH06273484A (ja) 半導体素子の検査装置
JPH0388174U (en])
JPS6222851Y2 (en])
JP2584020Y2 (ja) プローブユニット
JPH0611462Y2 (ja) 基板検査用コンタクトプローブ
JPH0191261U (en])
JPS6159272A (ja) プロービィング装置
JPH0283477U (en])
JPH0495883A (ja) 半導体特性評価装置
JPS6437681U (en])
JPS6220385U (en])
JPS6180469U (en])
JPS608882U (ja) インサ−キツトテスタ用フイクスチユア
JPS60134176U (ja) プリント基板の検査装置